Liu Biwei,: шукати на сайті Z-Library

IEEE Transactions on Device and Materials Reliability

Рік:

2012

Мова:

english

Файл:

PDF, 806 KB

english, 2012

Novel Layout Technique for Single-Event Transient Mitigation Using Dummy Transistor

Chen, Jianjun, Chen, Shuming, He, Yibai, Qin, Junrui, Liang, Bin, Liu, Biwei, Huang, Pengcheng

Журнал:

Рік:

2013

Мова:

english

Файл:

PDF, 1.02 MB

english, 2013

Simulation Study of the Layout Technique for P-hit Single-Event Transient Mitigation via the Source Isolation

Chen, Jianjun, Chen, Shuming, Liang, Bin, Liu, Biwei

Журнал:

IEEE Transactions on Device and Materials Reliability

Рік:

2012

Мова:

english

Файл:

PDF, 1.62 MB

english, 2012

Voltage Dependency of Propagating Single-Event Transient Pulsewidths in 90-nm CMOS Technology

Junrui Qin,, Shuming Chen,, Bin Liang,, Zhen Ge,, Yibai He,, Yankang Du,, Biwei Liu,, Jianjun Chen,, Dawei Li,

Журнал:

IEEE Transactions on Device and Materials Reliability

Рік:

2014

Мова:

english

Файл:

PDF, 251 KB

english, 2014

Single-Event Pulse Broadening After Narrowing Effect in Nano-CMOS Logic Circuits

Huang, Pengcheng, Chen, Shuming, Chen, Jianjun, Liang, Bin, Liu, Biwei

Журнал:

IEEE Transactions on Device and Materials Reliability

Рік:

2014

Мова:

english

Файл:

PDF, 1.63 MB

english, 2014

A Constrained Layout Placement Approach to Enhance Pulse Quenching Effect in Large Combinational Circuits

Du, Yankang, Chen, Shuming, Liu, Biwei

Журнал:

IEEE Transactions on Device and Materials Reliability

Рік:

2014

Мова:

english

Файл:

PDF, 1.53 MB

english, 2014

Tunable porous structure of metal organic framework derived carbon and the application in lithium–sulfur batteries

Li, Xia, Sun, Qian, Liu, Jian, Xiao, Biwei, Li, Ruying, Sun, Xueliang

Журнал:

Journal of Power Sources

Рік:

2016

Мова:

english

Файл:

PDF, 1.75 MB

english, 2016

Simulation Study of Node-State Transition Effect on the Single-Event Transient

Biwei, Liu, Yankang, Du, Zhao, Li, Lei, Li

Журнал:

IEEE Transactions on Device and Materials Reliability

Рік:

2015

Мова:

english

Файл:

PDF, 1.20 MB

english, 2015

A nitrogen-doped ordered mesoporous carbon/graphene framework as bifunctional electrocatalyst for oxygen reduction and evolution reactions

Zhang, Changlin, Wang, Biwei, Shen, Xiaochen, Liu, Jiawei, Kong, Xiangkai, Chuang, Steven S.C., Yang, Dong, Dong, Angang, Peng, Zhenmeng

Журнал:

Рік:

2016

Мова:

english

Файл:

PDF, 1.60 MB

english, 2016

Inkjet-printed silicon as high performance anodes for Li-ion batteries

Lawes, Stephen, Sun, Qian, Lushington, Andrew, Xiao, Biwei, Liu, Yulong, Sun, Xueliang

Журнал:

Рік:

2017

Мова:

english

Файл:

PDF, 1.31 MB

english, 2017

Origin of phase inhomogeneity in lithium iron phosphate during carbon coating

Liu, Yulong, Wang, Jiajun, Liu, Jian, Banis, Mohammad Norouzi, Xiao, Biwei, Lushington, Andrew, Xiao, Wei, Li, Ruying, Sham, Tsun-Kong, Liang, Guoxian, Sun, Xueliang

Журнал:

International Journal of Earth Sciences

Рік:

2017

Мова:

english

Файл:

PDF, 2.70 MB

english, 2017

Formation of size-dependent and conductive phase on lithium iron phosphate during carbon coating

Liu, Yulong, Liu, Jian, Wang, Jiajun, Banis, Mohammad Norouzi, Xiao, Biwei, Lushington, Andrew, Xiao, Wei, Li, Ruying, Sham, Tsun-Kong, Liang, Guoxian, Sun, Xueliang

Журнал:

Nature Communications

Рік:

2018

Мова:

english

Файл:

PDF, 3.70 MB

english, 2018

Flexible, high-resolution micro-optical coherence tomography endobronchial probe toward in vivo imaging of cilia

Cui, Dongyao, Chu, Kengyeh K., Yin, Biwei, Ford, Timothy N., Hyun, Chulho, Leung, Hui Min, Gardecki, Joseph A., Solomon, George M., Birket, Susan E., Liu, Linbo, Rowe, Steven M., Tearney, Guillermo J.

Журнал:

Optics Letters

Рік:

2017

Мова:

english

Файл:

PDF, 1.71 MB

english, 2017

Syn-collisional transform faulting of the Tan-Lu fault zone, East China

Guang Zhu, Guo Sheng Liu, Man Lan Niu, Cheng Long Xie, Yong Sheng Wang, Biwei Xiang

Журнал:

Рік:

2009

Мова:

english

Файл:

PDF, 1.03 MB

english, 2009

Research on single event transient pulse quenching effect in 90 nm CMOS technology

JunRui Qin, ShuMing Chen, BiWei Liu, JianJun Chen, Bin Liang, Zheng Liu

Журнал:

SCIENCE CHINA Physics, Mechanics & Astronomy

Рік:

2011

Мова:

english

Файл:

PDF, 676 KB

english, 2011

Charge collection of single event effects at Bragg’s peak

Zheng Liu, ShuMing Chen, Bin Liang, BiWei Liu, ZhenYu Zhao

Журнал:

Рік:

2011

Мова:

english

Файл:

PDF, 475 KB

english, 2011

Device-physics-based analytical model for SET pulse in sub-100 nm bulk CMOS Process

Qin, JunRui, Chen, ShuMing, Liu, BiWei, Liang, Bin, Chen, JianJun

Журнал:

SCIENCE CHINA Information Sciences

Рік:

2012

Мова:

english

Файл:

PDF, 1.06 MB

english, 2012

Novel Layout Technique for N-Hit Single-Event Transient Mitigation via Source-Extension

Jianjun Chen,, Shuming Chen,, Yibai He,, Yaqing Chi,, Junrui Qin,, Bin Liang,, Biwei Liu,

Журнал:

Рік:

2012

Мова:

english

Файл:

PDF, 1.06 MB

english, 2012

[IEEE 2009 10th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2009.03.16-2009.03.18)] 2009 10th International Symposium on Quality of Electronic Design - Combinational logic SER estimation with the presence of re-convergence

Liu, Biwei, Chen, Shuming, Xu, Yi

Рік:

2009

Мова:

english

Файл:

PDF, 243 KB

english, 2009

Effect of p-well contact on n-well potential modulation in a 90 nm bulk technology

YanKang Du, ShuMing Chen, BiWei Liu, Bin Liang

Журнал:

Рік:

2012

Мова:

english

Файл:

PDF, 688 KB

english, 2012

The effect of P+deep well doping on SET pulse propagation

JunRui Qin, ShuMing Chen, BiWei Liu, FanYu Liu, JianJun Chen

Журнал:

Рік:

2012

Мова:

english

Файл:

PDF, 756 KB

english, 2012

Novel N-hit single event transient mitigation technique via open guard transistor in 65nm bulk CMOS process

Huang, PengCheng, Chen, ShuMing, Chen, JianJun, Liu, BiWei

Журнал:

Biwei Yang, Lixia Lu, Dajiang Li, Li Liu, Libin Huang, Liyu Chen…

Рік:

2013

Мова:

english

Файл:

PDF, 927 KB

english, 2013

Colonic involvement in disseminated histoplasmosis of an immunocompetent adult: case report and literature review

Журнал:

BMC Infectious Diseases

Рік:

2013

Мова:

english

Файл:

PDF, 262 KB

english, 2013

Impact of pulse quenching effect on soft error vulnerabilities in combinational circuits based on standard cells

Yankang, Du, Shuming, Chen, Biwei, Liu

Журнал:

Microelectronics Journal

Рік:

2013

Мова:

english

Файл:

PDF, 518 KB

english, 2013

Calculating the Soft Error Vulnerabilities of Combinational Circuits by Re-Considering the Sensitive Area

Chen, Shuming, Du, Yankang, Liu, Biwei, Qin, Junrui

Журнал:

Рік:

2014

Мова:

english

Файл:

PDF, 1.00 MB

english, 2014

Segmental dynamics and physical aging of polystyrene/silver nanocomposites

Lin, Yu, Liu, Langping, Cheng, Jiaqi, Shangguan, Yonggang, Yu, Wenwen, Qiu, Biwei, Zheng, Qiang

Журнал:

RSC Advances

Рік:

2014

Мова:

english

Файл:

PDF, 1.33 MB

english, 2014

Atomic layer deposited aluminium phosphate thin films on N-doped CNTs

Liu, Jian, Tang, Yongji, Xiao, Biwei, Sham, Tsun-Kong, Li, Ruying, Sun, Xueliang

Журнал:

RSC Advances

Рік:

2013

Мова:

english

Файл:

PDF, 564 KB

english, 2013

Nanoscale stabilization of Li–sulfur batteries by atomic layer deposited Al2O3

Li, Xia, Liu, Jian, Wang, Biqiong, Banis, Mohammad N., Xiao, Biwei, Li, Ruying, Sham, Tsun-Kong, Sun, Xueliang

Журнал:

RSC Advances

Рік:

2014

Мова:

english

Файл:

PDF, 652 KB

english, 2014

Temperature Dependence of Digital SET Pulse Width in Bulk and SOI Technologies

Shuming, Chen, Bin, Liang, Biwei, Liu, Zheng, Liu

Журнал:

Biwei, Liu, Shuming, Chen

Рік:

2008

Мова:

english

Файл:

PDF, 549 KB

english, 2008

[IEEE 2008 Second Asia International Conference on Modelling & Simulation (AMS) - (2008.05.13-2008.05.15)] 2008 Second Asia International Conference on Modelling & Simulation (AMS) - Fast and Accurate Estimate SET Voltage Pulses from Transient Currents Induced by Heavy Ion

Рік:

2008

Мова:

english

Файл:

PDF, 303 KB

english, 2008

[IEEE 2008 Second Asia International Conference on Modelling & Simulation (AMS) - (2008.05.13-2008.05.15)] 2008 Second Asia International Conference on Modelling & Simulation (AMS) - Analysis of Glitch Reconvergence in Combinational Logic SER Estimation

Biwei, Liu, Shuming, Chen, Xiao, Hu

Рік:

2008

Мова:

english

Файл:

PDF, 373 KB

english, 2008

The Effect of Re-Convergence on SER Estimation in Combinational Circuits

Biwei, Liu, Shuming, Chen, Bin, Liang, Zheng, Liu, Zhenyu, Zhao

Журнал:

Рік:

2009

Мова:

english

Файл:

PDF, 464 KB

english, 2009

Temperature Dependency of Charge Sharing and MBU Sensitivity in 130-nm CMOS Technology

Liu, Biwei, Chen, Shuming, Liang, Bin, Liu, Zheng, Zhao, Zhenyu

Журнал:

Рік:

2009

Мова:

english

Файл:

PDF, 786 KB

english, 2009

[IEEE TENCON 2008 - 2008 IEEE Region 10 Conference (TENCON) - Hyderabad, India (2008.11.19-2008.11.21)] TENCON 2008 - 2008 IEEE Region 10 Conference - Coupled SET pulses modeling based on LUT in ultra deep submicron technology

Chen Shuming,, Liu Biwei,, Liang Bin,

Рік:

2008

Мова:

english

Файл:

PDF, 284 KB

english, 2008

Self-stacked nitrogen-doped carbon nanotubes as long-life air electrode for sodium-air batteries: Elucidating the evolution of discharge product morphology

Sun, Qian, Yadegari, Hossein, Banis, Mohammad N., Liu, Jian, Xiao, Biwei, Wang, Biqiong, Lawes, Stephen, Li, Xia, Li, Ruying, Sun, Xueliang

Журнал: